IEEE Transactions on Computers
SPECIAL SECTION ON FAULT DIAGNOSIS AND TOLERANCE IN CRYPTOGRAPHY
Luca Breveglieri - Politecnico di Milano, Milano, Italy
Workshop organised in association with
DSN 2004 - The International Conference
on Dependable Systems and Networks
Palazzo dei Congressi, Florence, ITALY
June 28 - July 1, 2004
In recent years applied cryptography has developed considerably, to satisfy the increasing security requirements of various information technology disciplines, e.g., telecommunications, networking, data base systems and mobile applications. In the past, cryptography mainly relied upon a small number of standard crypto-systems (or algorithms), e.g., DES (private key) and RSA (public key). In the last years, however, numerous novel cryptographic systems have been proposed, e.g.: AES (Advanced Encryption Standard) as a replacement of DES; the emerging ECC (Elliptic Curve Cryptosystems) technology for wireless network applications, which aims at possibly replacing the widespread RSA; and many others.
Crypto-systems are inherently computationally complex, and in order to satisfy the high throughput requirements of many applications, they are often implemented by means of either VLSI devices (crypto-accelerators) or highly optimised software routines (crypto-libraries) and are used via suitable (network) protocols.
The high complexity of such implementations raises concerns regarding their reliability. Research is therefore needed to develop methodologies and techniques for designing robust cryptographic systems (both hardware and software), and to protect them against both accidental faults and intentional intrusions and attacks, in particular those based on the malicious injection of faults into the device for the purpose of extracting the secret key.
Contributions to the workshop describing theoretical studies and practical case studies of fault diagnosis and tolerance in cryptographic systems (HW and SW) and protocols are solicited. Topics of interest include, but are not limited to:
Ø Modelling the reliability of cryptographic systems and protocols.
Ø Inherently reliable cryptographic systems and algorithms.
Ø Faults and fault models for cryptographic devices (HW and SW).
Ø Reliability-based attack procedures on cryptographic systems (fault-injection based attacks) and protocols.
Ø Adapting classical fault diagnosis and tolerance techniques to cryptographic systems.
Ø Novel fault diagnosis and tolerance techniques for cryptographic systems.
Ø Case studies of attacks, reliability and fault diagnosis and tolerance techniques in cryptographic systems.
The goals of the workshop are:
Ø Present the currently available preliminary results and challenges.
Ø Encourage collaboration among the current researchers and possibly enlarge the community of researchers in this field.
Ø Advertise the research topic to both the cryptography and fault tolerance research communities, and stimulate the start of new research activities.
Both academic and industrial applicants are invited to submit manuscripts to the workshop.
Summaries or short versions of the accepted contributions will be published in the Supplemental Volume of DSN.
Negotiations are underway for a special issue of a journal devoted to the topic of Fault Diagnosis and Tolerance in Cryptography.
Ø Submission deadline: March 5th, 2004
Ø Notification deadline: April 2nd, 2004
Ø Final paper deadline: April 30th, 2004
Ø Workshop: Wednesday, June 30th, 2004, Palazzo dei Congressi, Florence, ITALY
abstract of 5 to 10 pages, PDF format is preferred.
E-mail the ext. abs. to prof. Luca Breveglieri, mailto:firstname.lastname@example.org
Please provide name, affiliation, telephone and fax number, and email address.
Ø Luca Breveglieri, Politecnico di Milano, Milano, Italy
Ø Joan Daemen, STMicroelectronics - Proton Technology Division, Zaventem, Belgium
Ø Çetin Kaya Koç, Oregon State University, Corvallis, Oregon, USA
Ø Israel Koren, University of Massachusetts, Amherst, Massachusetts, USA
Ø David Naccache, Gemplus Card International, Issy-les-Moulineaux, France
Ø Ramesh Karri, Polytechnic University, Brooklyn, New York, USA
Ø Christof Paar, University of Ruhr, Bochum, Germany
Prof. Luca Breveglieri
Dept. of Electronic and Information Sciences
Politecnico di Milano
Piazza Leonardo Da Vinci n. 32
Tel: + 39 (0)2 2399 3653 office / 3401 switchboard
Fax: + 39 (0)2 2399 3411
Prof. Israel Koren
Department of Electrical and Computer Engineering
University of Massachusetts
Amherst, MA 01003
Tel: + 01 (413) 545-2643
Fax: + 01 (413) 545-1993