FDTC 2018: Final Program (PDF)
| 08:45 – 09:05 | Registration |
| 09:05 – 09:15 | Opening remarks |
| Session 1 – Laser Fault Attacks
Chair: Laurent Sauvage (Telecom ParisTech) |
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| 9.15 – 9:45 | Laser fault injection at the CMOS 28 nm technology node: an analysis of the fault model Jean-Max Dutertre, Vincent Beroulle, Stephan De Castro, Louis-Bathelemy Faber, Marie-Lise Flottes, Philippe Gendrier, David Hely, Régis Leveugle, Paolo Maistri, Giorgio Di Natale, Athanasios Papadimitriou and Bruno Rouzeyre |
| 9:45 – 10:15 | Latch-up-locked? – An empirical study on laser fault injection into ARM Cortex-M processors Bodo Selmke, Kilian Zinnecker, Philipp Koppermann, Katja Miller, Johann Heyszl and Georg Sigl |
| 10:15 – 10:45 | Morning break |
| Session 2 – Fault Attacks and Countermeasures
Chair: Begül Bilgin (Rambus) |
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| 10:45 – 11:15 | Breaking redundancy-based countermeasures with random faults and power side channel Sayandeep Saha, Shivam Bhasin, Dirmanto Jap, Jakub Breier, Debdeep Mukhopadhyay and Pallab Dasgupta |
| 11:15 – 11:45 | Darth's saber: a key exfiltration attack for symmetric ciphers using laser light Guido Bertoni, Vittorio Zaccaria, Maria Chiara Molteni and Filippo Melzani |
| 11:45 – 12:15 | Glitch-resistant masking schemes as countermeasure against fault sensitivity analysis Victor Arribas, Thomas De Cnudde and Danilo Sijacic |
| 12:15 – 13:15 | Lunch |
| Session 3 – Electromagnetic Fault Attacks
Chair: Elif Kavun (Infineon) |
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| 13:15 – 13:45 | Genetic algorithm-based electromagnetic fault injection Antun Maldini, Niels Samwel, Stjepan Picek and Lejla Batina |
| 13:45 – 14:15 | The impact of pulsed electromagnetic fault injection on true random number generators Maxime Madau, Michel Agoyan, Josep Balash, Milos Grujic, Patrick Haddad, Philippe Maurine, Vladimir Rozic, Dave Singelee, Ingrid Verbauwhede and Bohan Yang |
| Keynote Talk
Chair: Joan Daemen (Radboud Univ.) |
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| 14:15 – 15:05 | The SP800-90B approach to entropy sources John Kelsey |
| 15:05 – 15:35 | Afternoon break |
| Panel
Moderator: Marc Witteman (Riscure) |
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| 15:35 – 16:50 | Random generator testing and evaluation John Kelsey, Sylvain Guilley, Assia Tria, Werner Schindler |
| 16:50 – 17:00 | Closing remarks and Farewell |